Predicting target events in industrial domains

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Abstract

In industrial environments, machine faults have a high impact on productivity due to the high costs it can cause. Machine generated event logs are a abundant source of information for understanding the causes and events that led to a critical event in the machine. In this work, we present a Sequence-Mining based technique to automatically extract sequential patterns of events from machine log data for understanding and predicting machine critical events. By experiments using real data with millions of log entries from over 150 industrial computer numerical control (CNC) cutting machines, we show how our technique can be successfully used for understanding the root causes of certain critical events, as well as for building monitors for predicting them long before they happen, outperforming existing techniques.

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Borges, J., Neumann, M. A., Bauer, C., Ding, Y., Riedel, T., & Beigl, M. (2017). Predicting target events in industrial domains. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 10358 LNAI, pp. 17–31). Springer Verlag. https://doi.org/10.1007/978-3-319-62416-7_2

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