Skip to main content
Book Chapter

Integrated Circuit Design and Electromigration

  • Lienig J
  • Thiele M
Springer International Publishing, (2018), 61-98
DOI: 10.1007/978-3-319-73558-0_3
N/ACitations
Citations of this article
2Readers
Mendeley users who have this article in their library.
Get full text

Cite

CITATION STYLE

APA

Lienig, J., & Thiele, M. (2018). Integrated Circuit Design and Electromigration. In Fundamentals of Electromigration-Aware Integrated Circuit Design (pp. 61–98). Springer International Publishing. https://doi.org/10.1007/978-3-319-73558-0_3

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free