CITATION STYLE
Gu, L., Sigle, W., Koch, C. T., Srot, V., Nelayah, J., & van Aken, P. A. (2008). Band gap mapping using monochromated electrons. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 381–382). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_191
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