CITATION STYLE
Koch, C. T., Bellina, P., & van Aken, P. A. (2008). Software Precession Electron Diffraction. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 201–202). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_101
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