Automated Defect Inspection Algorithm Incorporated Spectral-Domain Optical Coherence Tomography for Optical Polarizing Thin Films

Abstract

Optical polarizing thin film is an optical filter enables light waves of a specific polarization pass through while blocking light waves of other polarizations. Optical polarizing thin films control the brightness of back-light unit for LCD (liquid crystal display) panel, which is essential to produce LCD modules. Defect inspection of polarizing thin films is an important feature during the manufacturing process that is helpful to improve the product quality. In the current study, an automated defect inspection algorithm is introduced and incorporated with a well-known non-destructive and non-contact optical inspection method called spectral domain optical coherence tomography (SD-OCT) to pre-identify defective sub-surface as well as top-surface locations of optical polarizing thin films Polarizing thin films employed in this study consist of 6 layers. The tomographic information, layer information, and defective locations were sufficiently identified through the SD-OCT system owing high-axial resolution. The acquired results indicate the possible application of the proposed system in optical polarizing thin films for the quality assurance.