Dynamic VLSI methods for OLSE and syndrome calculation using synchronized mitigation procedures for intact circuit functionality

0Citations
Citations of this article
1Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Now a days in VLSI design circuit’s reliability has become the major parameter of concern. With the consistently expanding requests for higher speed and lower control correspondence frameworks, productive VLSI executions of those blunder redress codes have extraordinary significance for reasonable applications. There exists various synchronized moderation procedures proposed to ensure that the blunders don't influence the circuit usefulness. Among them, to ensure the recollections and registers in electronic circuits Error Correction Codes (ECC) is normally utilized. At whatever point any ECC method is utilized, the encoder and decoder circuit may likewise endure mistakes. Here synchronized slip identification Also revision method to OLS encoders (OLSE) What's more syndrome figuring is suggested What's more assessed. Those suggested technique proficiently executes An equality prediction plan that detects the greater part errors that influence An solitary out hub utilizing the properties of OLS codes. Today VLSI design means usage of Verilog or VHDL. In this research work Verilog HDL is used for simulation and Synplify for synthesis purpose.

Author supplied keywords

Cite

CITATION STYLE

APA

Anjum, F., Keerthana, P., Reddy, K., Kiran, & Samhitha. (2019). Dynamic VLSI methods for OLSE and syndrome calculation using synchronized mitigation procedures for intact circuit functionality. International Journal of Recent Technology and Engineering, 8(2 Special Issue 4), 367–386. https://doi.org/10.35940/ijrte.B1074.0782S419

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free