Electron energy loss is a physical process whose probability decreases sharply with the amount of energy loss involved in any single inelastic scattering event 1. This physical fact means that the electron energy-loss spectrum (EELS), after correcting for multiple scattering effects, has a very strong intensity at low energy loss but the intensity decays rapidly with the increase in energy loss. When the electrons not losing any significant energy (the so-called zeroloss beam) is also considered, the dynamical range of EELS is huge and often exceeds the capability of any physical detectors.
CITATION STYLE
Zhang, H.-B., Cao, M., Lu, Y., Li, C., Nishi, R., & Takaoka, A. (2009). Relevance of the minimum projection number to specimen structures for high-quality electron tomography. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 345–346). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_173
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