Surface-modified CuO layer in size-stabilized single-phase Cu2O nanoparticles

Abstract

Activated reactive evaporation has been used to grow copper oxide nanoparticles in the size range of 8-100 nm. X-ray diffraction spectra clearly show the presence of a single Cu2O phase. Detailed x-ray photoelectron spectroscopy studies show an increase in the ionicity of the Cu2O system with decreasing particle size. Depth profiling and finger printing of x-ray photoelectron spectra reveal that the Cu2O nanoparticles are capped with a CuO surface layer of thickness ≈1.6 nm. This study strongly suggests that the stabilization of the cubic Cu2O nanophase is enhanced by the formation of a CuO surface layer. © 2001 American Institute of Physics.