A Mask Able to Make Nano-Meter-Order Line-and-Space for Fast Atom Beam Manufacturing

  • SOEDA T
  • KAMIYA D
  • HORIE M
N/ACitations
Citations of this article
N/AReaders
Mendeley users who have this article in their library.
Get full text

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Cite

CITATION STYLE

APA

SOEDA, T., KAMIYA, D., & HORIE, M. (2002). A Mask Able to Make Nano-Meter-Order Line-and-Space for Fast Atom Beam Manufacturing. The Proceedings of the Conference on Information, Intelligence and Precision Equipment : IIP, 2002(0), 84–85. https://doi.org/10.1299/jsmeiip.2002.84

Save time finding and organizing research with Mendeley

Sign up for free