Probe calibration in magnetic force microscopy

Abstract

Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.