Holographic fabrication of designed functional defect lines in photonic crystal lattice using a spatial light modulator

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Abstract

We report the holographic fabrication of designed defect lines in photonic crystal lattices through phase engineering using a spatial light modulator (SLM). The diffracted beams from the SLM not only carry the defect's content but also the defect related phase-shifting information. The phase-shifting induced lattice shifting in photonic lattices around the defects in three-beam interference is less than the one produced by five-beam interference due to the alternating shifting in lattice in three beam interference. By designing the defect line at a 45 degree orientation and using three-beam interference, the defect orientation can be aligned with the background photonic lattice, and the shifting is only in one side of the defect line, in agreement with the theory. Finally, a new design for the integration of functional defect lines in a background phase pattern reduces the relative phase shift of the defect and utilizes the different diffraction efficiency between the defect line and background phase pattern. We demonstrate that the desired and functional defect lattice can be registered into the background lattice through the direct imaging of designed phase patterns.

Figures

  • Figure 1. (a) An enlarged view of the checkerboard phase pattern displayed on the SLM. The dashed purple square indicates the size of one unit cell of 8 × 8 μm2. (b) CCD image of the diffraction pattern at the Fourier plane. The red circles indicate beams passing through the Fourier filter. (c) Scheme of the five beam interference arranged four-fold symmetrically. Beam 5 propagates along the z-axis. (d) Simulated intensity distribution for the interference of the four first order beams with the central zero order beam after the 4f imaging system. Scale bar is for 8 μm.
  • Figure 2. (a) Checkerboard phase pattern (with gray levels 30 and 255) and designed line defect (gray level 255). Each bright or dark square in the pattern represents a single square SLM pixel. (b) Close-up of portion of line defect in phase pattern. Arrows indicate the direction of the lattice shift due to the phase shift. Red square represents the unit cell for calculating phases of the interfering beams. (c) Optical microscope image of fabricated structures in DPHPA. Scale bar is for 8 μm.
  • Figure 3. (a) Checkerboard phase pattern with black (gray level 30) defect line. (b) Enlarged view of line defect in phase pattern. Arrows indicate the direction of the lattice shift due to the presence of the line defect phase. The red square represents the unit cell for calculating phases of the beams. (c) Optical microscope image of line defect embedded in PhC lattice in DPHPA fabricated through holographic lithography. Scale bar is for 8 μm.
  • Figure 4. (a) CCD image of the diffraction pattern at the Fourier plane. The red circles indicate beams passing through the Fourier filter. (b) Interference pattern of two 1st order side beams with the central zero order beam. Scheme of white (gray level 255) (c) and dark (gray level of 33) (d) defect phase. Blue arrows indicate direction of the lattice shift due to the presence of the defect. (e,f) Optical microscope images of fabricated defects in PhC lattice using the defect phases in background phase pattern in (c,d), respectively. Scale bars are for 8 μm.
  • Figure 5. (a) Enlarged view of a diagonal line defect phase in the checkerboard phase pattern; (b) diagram of defect phase with accompanying lattice shifts indicated by the red arrows; (c) optical microscope image of fabricated structures in DPHPA produced by overlapping two of the 1st order beams with the central zero order region diffracted from the phase pattern in (a) displayed on the SLM. The red arrow indicates the pattern shifting direction. The dashed blue line indicates the location of lattices if there is no pattern shifting. Scale bar is for 8 μm.
  • Figure 6. (a) CCD image of the diffraction pattern in the Fourier plane f1. All images are rotated 45° to orient the defect along the horizontal direction. Beams (1 and 2) were filtered out with a mask. (b) The phase pattern displayed on the SLM and an optical microscope image of the fabricated structure. The background of the SLM image consists of single pixels of grey levels 254 and 158 and in the defect, the grey pixels have been changed to 224. (c) CCD image of the interference pattern and optical microscope image of the recorded interference generated by the phase pattern in (b), however, with a longer defect. Scale bars are for 5.65 μm as measured by atomic force microscope.

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CITATION STYLE

APA

Lutkenhaus, J., Lowell, D., George, D., Zhang, H., & Lin, Y. (2016). Holographic fabrication of designed functional defect lines in photonic crystal lattice using a spatial light modulator. Micromachines, 7(4). https://doi.org/10.3390/mi7040059

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