Conducting scanning probe microscopy provides a powerful tool for measuring electric transport through small surface features. In this chapter, carbon nanotubes and carbon nanotube networks are analyzed with a scanning probe microscopy method that employs solid metal tips to provide improved electrical contact to the nanotubes. The study reveals paths of electrical transport through carbon nanotubes and provides a means to differentiate between semiconducting and metallic nanotubes. Finally, high-resolution images provide insight into the conductance decay around nanotube junctions. © 2007 Springer Science+Business Media, LLC.
CITATION STYLE
Stadermann, M., & Washburn, S. (2007). Conductance AFM measurements of transport through nanotubes and nanotube networks. In Scanning Probe Microscopy (Vol. 2, pp. 440–454). Springer New York. https://doi.org/10.1007/978-0-387-28668-6_16
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