Boron-Oxygen Metastable Defects Degradation of Carrier Lifetime by Illumination in Cz and Multicrystalline P-Type Silicon Wafers

Bouhafs, D., Tahraoui, C., Kouhlane, Y., Khelifati, N., Si-Kaddour, R., Amrouch, H., & Baba Ahmed, L. (2020). Boron-Oxygen Metastable Defects Degradation of Carrier Lifetime by Illumination in Cz and Multicrystalline P-Type Silicon Wafers (pp. 261–268). https://doi.org/10.1007/978-981-15-5444-5_33