Angle-of-incidence dependence of photoemission of a localized electron from a jellium solid

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Abstract

We show via a calculation for a localized electron in a jellium solid that an escape-cone mechanism accounts for a significant component of the peak seen by Rowe and Christman in photoyield data as a function of angle of incidence for Ar embedded in Ge(111) and Si(111) surfaces. © 1976 The American Physical Society.

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APA

Feibelman, P. J., & Eastman, D. E. (1976). Angle-of-incidence dependence of photoemission of a localized electron from a jellium solid. Physical Review Letters, 36(4), 234–236. https://doi.org/10.1103/PhysRevLett.36.234

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