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Xrd Strain and Stress Determination in Nanostructured Films and Coatings

  • Tsakalakos T
  • Croft M
Springer Netherlands, (2000), 223-230
DOI: 10.1007/978-94-011-4052-2_19
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Tsakalakos, T., & Croft, M. (2000). Xrd Strain and Stress Determination in Nanostructured Films and Coatings. In Nanostructured Films and Coatings (pp. 223–230). Springer Netherlands. https://doi.org/10.1007/978-94-011-4052-2_19

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