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Journal ArticleOPEN ACCESS

Direct observation of Na and O impurities at grain surfaces of CuInSe2 thin films

  • Niles D
  • Al-Jassim M
  • Ramanathan K
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (1999) 17(1) 291-296
DOI: 10.1116/1.581583
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Abstract

The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.

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CITATION STYLE

APA

Niles, D. W., Al-Jassim, M., & Ramanathan, K. (1999). Direct observation of Na and O impurities at grain surfaces of CuInSe2 thin films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 17(1), 291–296. https://doi.org/10.1116/1.581583

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