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Book Chapter

Analysis of multimodal 3D microscopy measurements

  • Ritter M
  • Kranzmann A
  • Hemmleb M
Springer Berlin Heidelberg, (2008), 375-376
DOI: 10.1007/978-3-540-85228-5_188
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Ritter, M., Kranzmann, A., & Hemmleb, M. (2008). Analysis of multimodal 3D microscopy measurements. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 375–376). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85228-5_188

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